Investigation of the optical and acoustical phonon modes in Si₁₋xGex QD SLs

Abstract

Single- and multilayer structures with Si₁₋xGex nanoislands have been investigated using the Raman scattering technique. The values of the mechanical strain and composition were determined in the islands of the both structures. For multilayer structure a low-frequency Raman spectrum was obtained due to the scattering on folded acoustical phonons. The experimental values of the peaks are compared with those derived theoretically.