Magnetic and magnetoresistive characteristics of neutron-irradiated Si₀.₉₇Ge₀.₀₃ whiskers
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Анотація
The effect of 8.6∙10¹⁷ n/cm² with fast neutron irradiation on the magnetic
susceptibility of Si₀.₉₇Ge₀.₀₃ thread-like crystals (whiskers) with impurity concentration
near metal-insulator junction has been studied. Significant differences have been
observed in the change of magnetic susceptibility of irradiated whiskers and bulk Cz-Si.
The low-temperature (4.2…40 K) changes of magnetoresistance in magnetic fields up to
14 T, caused by irradiation, have been studied. It has been established that at
temperatures near 4.2 K, a significant contribution to the conductivity is made by light
charge carriers of low concentration but with high mobility. The level supplying these
charge carriers has the energy of e = 2.1 meV, and with application of magnetic field it
increases up to e = 2.5 meV in approx. 10 T field. It demonstrates the fact that the reason
of magnetoresistance, beside the magneto-field decrease of mobility, is the magneto-field
decrease in the free carrier concentration. At temperatures approx. 40 K, conductivity is
due to holes, the activation energy whereof is e = 11.5 meV, which is practically
independent of the magnetic field.
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Magnetic and magnetoresistive characteristics of neutron-irradiated Si₀.₉₇Ge₀.₀₃ whiskers / P.G. Litovchenko, N.T. Pavlovska, Yu.V. Pavlovskyy, Yu.O. Ugrin, G. Luka, I.P. Ostrovskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 4. — С. 416-420. — Бібліогр.: 12 назв. — англ.