Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions
Завантаження...
Дата
Автори
Назва журналу
Номер ISSN
Назва тому
Видавець
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Анотація
The nonlinear boundary axially symmetric problem of heat conduction for the
thermosensitive piecewise homogeneous layer with reach-through cylindrical inclusion
that generates heat has been considered. Using the introduced function, the partial
linearization of the original problem has been carried out. With the proposed piecewiselinear
approximation of temperature at the boundary surface of the foreign inclusion and
on the contact surface of the homogeneous elements of the layer, the problem has been
completely linearized. The analytical solution of this problem of finding the introduced
function using Hankel integral transform has been formed. The formulae for calculating
the desired temperature have been derived.
Опис
Теми
Цитування
Thermal state modeling in thermosensitive elements of
microelectronic devices with reach-through foreign inclusions / V.I Gavrysh.// Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 3. — С. 247-251. — Бібліогр.: 13 назв. — англ.