New materials for luminescent scanning near-field microscopy

Abstract

Results on synthesis and characterization of the luminescent probes for applications in determination of near-field optical characteristics and spatial distribution of local temperature are presented. Two types of materials are studied: Eu³⁺ doped vanadates LaVO₄, and chromium-doped composites (NaAl(MoO₄)₂/Al₂O₃):Cr. It was shown that submicron-sized particles of the mentioned materials can be used for development of the luminescent probes for near-field optical applications.