Precise measurements of the wavelength in KrCl laser spectral region (222 nm)

dc.contributor.authorZubrilin, N.G.
dc.contributor.authorPavlov, I.A.
dc.contributor.authorBaschenko, S.M.
dc.contributor.authorTkachenko, O.M.
dc.date.accessioned2017-06-14T16:45:28Z
dc.date.available2017-06-14T16:45:28Z
dc.date.issued2016
dc.description.abstractThe technique for precise measurements of wavelengths in the range around 222 nm (45030 cm⁻¹) has been presented. The reciprocal linear dispersion of the spectrometer was 0.529 Å/mm. The measurements were made in the second spectral order for a grating with 2400 lines/mm. Identification of emission lines of hollow cathode lamp (Fe) was made in the spectral range 4428…4452 Å. The wavelengths were measured for 32 identified lines in the spectrum. The mean square error of easurements is ∼0.0005 Å.uk_UA
dc.description.sponsorshipThe authors thank to Prof. I. Dmitruk for useful discussions.uk_UA
dc.identifier.citationPrecise measurements of the wavelength in KrCl laser spectral region (222 nm) / N.G. Zubrilin, I.A. Pavlov, S.M. Baschenko, O.M. Tkachenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 2. — С. 188-191. — Бібліогр.: 7 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherDOI: 10.15407/spqeo19.02.188
dc.identifier.otherPACS 42.60.Jf, 42.62.Fi
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/121561
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titlePrecise measurements of the wavelength in KrCl laser spectral region (222 nm)uk_UA
dc.typeArticleuk_UA

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