The exact solution of self-consistent equations in the scanning near-field optic microscopy problem

dc.contributor.authorLozovski, V.
dc.contributor.authorBozhevolnyi, S.
dc.date.accessioned2017-06-10T08:02:35Z
dc.date.available2017-06-10T08:02:35Z
dc.date.issued1999
dc.description.abstractThe macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for solving the self-consistent integral equation. The method developed is applied to calculations of near-field optical images obtained in illumination mode. It is assumed that the system under consideration consists of an object illuminated by the field scattered by a small probe. This assumption allows us to consider multiple scattering between a (point-like) probe and an extended object as well as inside the object. The exact solution for the self-consistent field is then obtained in terms of effective susceptibility of the probe-object system. Application of our method to the description of orientation of molecular complexes at the surface is discussed.uk_UA
dc.identifier.citationThe exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 42.65.K
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/119866
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleThe exact solution of self-consistent equations in the scanning near-field optic microscopy problemuk_UA
dc.typeArticleuk_UA

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