Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection

dc.contributor.authorSeverin, V.S.
dc.date.accessioned2017-05-26T12:50:11Z
dc.date.available2017-05-26T12:50:11Z
dc.date.issued2011
dc.description.abstractThe dielectric permeability of the free-electron system in semiconductor is usually considered using the Drude-Lorentz model without taking into account this system polarization. But it seems reasonable to include polarization phenomena into consideration of the free-electron system behavior. In this paper, the position of minimum in plasma optical reflection by the system of free electrons is analyzed with allowance for this system polarization. This position can substantially differ from that given via calculation of it within the framework of the traditional Drude-Lorentz model. This difference is significant when analyzing the available experimental results.uk_UA
dc.identifier.citationInfluence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection / V.S. Severin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 2. — С. 175-178. — Бібліогр.: 15 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 77.22.Ch, Ej, 78.20.Bh, Ci, -e
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/117710
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleInfluence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflectionuk_UA
dc.typeArticleuk_UA

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