Electron emission modulation effects in micro-size structures

dc.contributor.authorHartnagel, H.
dc.date.accessioned2017-05-27T16:49:34Z
dc.date.available2017-05-27T16:49:34Z
dc.date.issued2003
dc.description.abstractA promising application of field-emission phenomena is microwave high-frequency oscillation generation. In this presentation, new effects at the field emission, as a perspective mechanism of high-frequency oscillation generation, has been investigated and analyzed. The mechanisms are connected with the generation of oscillations in field emission structures (i) based on the silicon or GaAs tips with ultrathin diamond-like carbon (DLC) films, (ii) III-V semiconductors (GaAs, GaN) and (iii) SiGe materials.uk_UA
dc.description.sponsorshipThis work was supported in part by the DLR (BMBF) in connection with German-Ukrainian projects (UKR 01/053) entitled "Electron Emission Properties of the DLC Films and C-Nanotubes" and in part by the "Deutsche Forschungsgemeinschafit (DFG)" in connecntion with a special research project (SFB 241) on innovative mechatronics.uk_UA
dc.identifier.citationElectron emission modulation effects in micro-size structures / H. Hartnagel // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 1. — С. 62-67. — Бібліогр.: 16 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 79.70.+q
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/117943
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleElectron emission modulation effects in micro-size structuresuk_UA
dc.typeArticleuk_UA

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