Optoelectronic sensor of longitudinal and angular displacements
dc.contributor.author | Dlugaszek, A. | |
dc.contributor.author | Jabczynski, J. | |
dc.contributor.author | Janucki, J. | |
dc.contributor.author | Skrzeczanowski, W. | |
dc.date.accessioned | 2017-06-10T08:04:07Z | |
dc.date.available | 2017-06-10T08:04:07Z | |
dc.date.issued | 1999 | |
dc.description.abstract | In the sensor a triangulation method of displacement measurement has been used. A method of sensor calibration using interferometric distance measurements has been elaborated. Linearity and resolution investigations have been performed for different parameter sets of sensor transmitting-receiving head. An accuracy of displacement measurements depends on parameters of a beam illuminating a surface being displaced, parameters of a position sensitive detector and on a signal-to-noise ratio of a signal analog processing block. Results of investigations of uncertainties of lathe slide shifts are also presented. | uk_UA |
dc.identifier.citation | Optoelectronic sensor of longitudinal and angular displacements / A. Dlugaszek, J. Jabczynski, J. Janucki, W. Skrzeczanowski // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 71-73. — Бібліогр.: 5 назв. — англ. | uk_UA |
dc.identifier.issn | 1560-8034 | |
dc.identifier.other | PACS 07.07.D, 42.79.P,Q | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/119869 | |
dc.language.iso | en | uk_UA |
dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
dc.status | published earlier | uk_UA |
dc.title | Optoelectronic sensor of longitudinal and angular displacements | uk_UA |
dc.type | Article | uk_UA |
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