Influence of elastic deformation on the residual ellipticity of polished optical materials

dc.contributor.authorMaslov, V.P.
dc.contributor.authorSarsembaeva, A.Z.
dc.contributor.authorSizov, F.F.
dc.date.accessioned2017-05-28T16:35:57Z
dc.date.available2017-05-28T16:35:57Z
dc.date.issued2003
dc.description.abstractThe elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, there are no data upon investigations of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ellipsometry, the influence of elastic deformation on the residual ellipticity of polished samples made of optical materials was studied. The results obtained during the researches have shown that the application of elastic deformations leads to essential changes of the minimum ellipticity tgp of polished samples, which testifies to the necessity to take into account this circumstance for devices of adaptive optics, input windows, cryostats and other optical parts working with the changing temperature.uk_UA
dc.identifier.citationInfluence of elastic deformation on the residual ellipticity of polished optical materials / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 514-516. — Бібліогр.: 7 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 42.86.+b, 78.20.-e
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118078
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleInfluence of elastic deformation on the residual ellipticity of polished optical materialsuk_UA
dc.typeArticleuk_UA

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