Influence of complex defects on electrophysical properties of GaP light emitting diodes

dc.contributor.authorKonoreva, O.
dc.contributor.authorMalyj, E.
dc.contributor.authorMamykin, S.
dc.contributor.authorPetrenko, I.
dc.contributor.authorPinkovska, M.
dc.contributor.authorTartachnyk, V.
dc.date.accessioned2017-05-30T06:02:12Z
dc.date.available2017-05-30T06:02:12Z
dc.date.issued2014
dc.description.abstractIn order to estimate the role of complex defects on GaP light emitting diodes (LED) operation, luminescent and electrical characteristics of GaP LEDs irradiated with reactor neutrons have been studied. It has been stated that nonradiative levels of radiation defects affect electroluminescence quenching. From the analysis of the tunnel current, the density of dislocations in the depleted part of the p–n junction was obtained. Neutron induced disorder regions do not change the tunnel component of the direct current of red diodes, increasing the dislocation density, because the carrier flow along the “tunnel shunts” is blocked.uk_UA
dc.identifier.citationInfluence of complex defects on electrophysical properties of GaP light emitting diodes / O. Konoreva, E. Malyj, S. Mamykin, I. Petrenko, M. Pinkovska, V. Tartachnyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 2. — С. 184-187. — Бібліогр.: 9 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 29.40.-n, 85.30.-z, 85.60.Dw
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118369
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleInfluence of complex defects on electrophysical properties of GaP light emitting diodesuk_UA
dc.typeArticleuk_UA

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