Spectral dependence of the photomagnetic effect in porous silicon
dc.contributor.author | Vakulenko, O.V. | |
dc.contributor.author | Kondratenko, S.V. | |
dc.contributor.author | Serdega, B.K. | |
dc.date.accessioned | 2017-06-05T17:11:07Z | |
dc.date.available | 2017-06-05T17:11:07Z | |
dc.date.issued | 2001 | |
dc.description.abstract | Measurements of the photomagnetic effect spectra of PS/c-Si were carried out. Obtained results were explained by influence of the spatial charge region of the heterojunction between wide-band porous silicon and c-Si substrate of the n-type. The form of the PME spectrum in the long-wave region indicates to the drift of the nonequilibrium charge carriers in the c-Si to the PS/c-Si boundary, that is presence of the increased spatial charge layer in c-Si. Relatively high value of the PME in the strong absorption region of the porous silicon indicates to the presence of the PME component caused by porous silicon material. | uk_UA |
dc.identifier.citation | Spectral dependence of the photomagnetic effect in porous silicon / O.V. Vakulenko, S.V. Kondratenko, B.K. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 3. — С. 159-162. — Бібліогр.: 16 назв. — англ. | uk_UA |
dc.identifier.issn | 1560-8034 | |
dc.identifier.other | PACS: 72.40. | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/119265 | |
dc.language.iso | en | uk_UA |
dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
dc.status | published earlier | uk_UA |
dc.title | Spectral dependence of the photomagnetic effect in porous silicon | uk_UA |
dc.type | Article | uk_UA |
Файли
Оригінальний контейнер
1 - 1 з 1
Завантаження...
- Назва:
- 04-Vakulenko.pdf
- Розмір:
- 82.15 KB
- Формат:
- Adobe Portable Document Format
Контейнер ліцензії
1 - 1 з 1
Завантаження...
- Назва:
- license.txt
- Розмір:
- 817 B
- Формат:
- Item-specific license agreed upon to submission
- Опис: