Modeling high performance multilayer antireflection coatings for visible and infrared (3-5μm) substrates

dc.contributor.authorAsghar, M.H.
dc.contributor.authorKhan, M.B.
dc.contributor.authorNaseem, S.
dc.date.accessioned2017-05-28T16:35:26Z
dc.date.available2017-05-28T16:35:26Z
dc.date.issued2003
dc.description.abstractMultilayer antireflection coatings have been modeled in visible and IR (3-5μm) bands to reduce reflectance from glass, germanium (Ge), silicon (Si) and zinc selenide (ZnSe) substrates. The transmittance of bare glass substrate is around 95% whereas for Ge 64%, Si 70%, ZnSe 84%. Theses values are enhanced reasonably by the application of multilayers films. Starting from a single layer, the layers have been added systematically forming multilayer structures to reduce reflectance considerably with each increasing layer. The designed layers are optimized for their performance by varying their thickness and refractive indices. The analysis of these modals has shown that the proposed multilayer structures are very effective in reducing the reflectance for all the substrates in two spectra.uk_UA
dc.identifier.citationModeling high performance multilayer antireflection coatings for visible and infrared (3-5μm) substrates / M.H. Asghar, M.B. Khan, S. Naseem // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 508-513. — Бібліогр.: 19 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 42.79.Wc, 78.20.-e
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118077
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleModeling high performance multilayer antireflection coatings for visible and infrared (3-5μm) substratesuk_UA
dc.typeArticleuk_UA

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