Methods of cluster analysis in sensor engineering: advantages and faults

dc.contributor.authorBurlachenko, Yu.V.
dc.contributor.authorSnopok, B.A.
dc.date.accessioned2017-05-30T16:19:45Z
dc.date.available2017-05-30T16:19:45Z
dc.date.issued2010
dc.description.abstractWe consider the crisp and fuzzy partitioning techniques of cluster analysis bearing in mind their application for classification of data obtained with chemical sensor arrays. The advantage of the cluster analysis techniques is existence of a parameter S(i). This parameter gives quantitative efficiency of classification and can be used as optimization criterion for sensor system as a whole as well as the measurement procedure. The crisp and fuzzy techniques give practically the same result when analyzing the data that cluster uniquely. It is shown that big value of the parameter S(i) is not sufficient for adequate data partitioning into cluster in more complicated cases, and the results of clusterization for the above techniques may diverge. In this case, one should apply both techniques concurrently, checking the correctness of partitioning into clusters against the principal component analysis.uk_UA
dc.description.sponsorshipThis work got a financial support from the National Academy of Sciences of Ukraine.uk_UA
dc.identifier.citationMethods of cluster analysis in sensor engineering: advantages and faults / Yu.V. Burlachenko, B.A. Snopok // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 393-397. — Бібліогр.: 13 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 07.07.Df
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118565
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleMethods of cluster analysis in sensor engineering: advantages and faultsuk_UA
dc.typeArticleuk_UA

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