Crystallochemistry of defects in lead telluride films

dc.contributor.authorFreik, D.M.
dc.contributor.authorRuvinskii, M.A.
dc.contributor.authorRuvinskii, B.M.
dc.contributor.authorGalushchak, M.A.
dc.date.accessioned2017-06-05T14:46:59Z
dc.date.available2017-06-05T14:46:59Z
dc.date.issued2001
dc.description.abstractThe crystallochemical model of vapor-phase epitaxy of the lead telluride films has been proposed with the supposition about the simultaneous formation of singly charged, doubly charged and electroneutral Frenkel defects in the cationic sublattice. It has been shown that in spite of the large concentration of partly compensated doubly charged defects the singly charged Frenkel pairs Pbi⁺ and VPb⁻ also play an essential role in change carrier concentration in PbTe films. The results of numerical calculation agree with the available experimental data of the dependence of charge carrier's concentration in films upon the partial pressure of tellurium vapor and the deposition's temperature in the hot-wall method.uk_UA
dc.identifier.citationCrystallochemistry of defects in lead telluride films / D.M. Freik, M.A. Ruvinskii, B.M. Ruvinskii, M.A. Galushchak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 1. — С. 5-8. — Бібліогр.: 13 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 72.20.M, 73.40
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/119233
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleCrystallochemistry of defects in lead telluride filmsuk_UA
dc.typeArticleuk_UA

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