Injection current and infrared photosensitivity in isotype p-PbTe/p-CdTe heterojunctions

dc.contributor.authorTetyorkin, V.V.
dc.contributor.authorSukach, A.V.
dc.contributor.authorTkachuk, A.I.
dc.contributor.authorMovchan, S.P.
dc.date.accessioned2017-05-26T06:00:07Z
dc.date.available2017-05-26T06:00:07Z
dc.date.issued2013
dc.description.abstractIso-type p-PbTe/p-CdTe heterojunctions were grown on BaF2 substrates by using the hot-wall epitaxy technique. The growth details are presented. The carrier transport mechanism was investigated by means of the current-voltage measurements. At 77 K the dominant conduction mechanism was found to be the space-charge-limited current. The photovoltaic response in the long-wave infrared region with the half-peak cut-off wavelength ranged from 8.0 to 9.0 m was observed in these heterojunctions for the first time. The possible mechanism of the photoresponse is the internal photoemission of holes from p-PbTe across the heterojunction barrier.uk_UA
dc.identifier.citationInjection current and infrared photosensitivity in isotype p-PbTe/p-CdTe heterojunctions / V.V. Tetyorkin, A.V. Sukach, A.I. Tkachuk, S.P. Movchan // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 1. — С. 59-63. — Бібліогр.: 22 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 73.40.-c, 73.61.Ga, 78.30.Fs
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/117663
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleInjection current and infrared photosensitivity in isotype p-PbTe/p-CdTe heterojunctionsuk_UA
dc.typeArticleuk_UA

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