Effect of the structure of polarimeter characteristic matrix on light polarization measurements

dc.contributor.authorSavenkov, S.N.
dc.contributor.authorOberemok, Ye.A.
dc.contributor.authorKlimov, O.S.
dc.contributor.authorBarchuk, О.I.
dc.date.accessioned2017-05-31T19:46:09Z
dc.date.available2017-05-31T19:46:09Z
dc.date.issued2009
dc.description.abstractIn the paper, we carried out the comparative analysis of three polarimeters among the most usable their variants: (i) Stokes polarimeter based on phenomenological definition of Stokes parameters; (ii) Stokes polarimeter based on the method of four intensities; (iii) Stokes dynamic polarimeter. We show that, since the accuracy in determination of individual Stokes parameter is different for different types of polarimeters, and, therewith, it depends on polarization of input light. All that strongly motivates the choice of type of polarimeter to provide minimum errors in determination of polarization parameters (ellipticity angle ε, azimuth β, and degree of polarization P).uk_UA
dc.identifier.citationEffect of the structure of polarimeter characteristic matrix on light polarization measurements / S.N. Savenkov, Ye.A. Oberemok, O.S. Klimov, О.I. Barchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С.264-271. — Бібліогр.: 26 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 07.60.Fs
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118872
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleEffect of the structure of polarimeter characteristic matrix on light polarization measurementsuk_UA
dc.typeArticleuk_UA

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