A free-space alignment technique for active optical waveguide components

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dc.contributor.authorKarim, A.
dc.date.accessioned2017-06-13T20:42:01Z
dc.date.available2017-06-13T20:42:01Z
dc.date.issued2002
dc.description.abstractIn this paper an easy to use free-space alignment technique for the alignment of different active optical waveguide components is reported. This technique has successfully been implemented for the characterization of waveguide photodetectors with an intrinsic layer thickness of 0.15 m. This technique is found to be very reliable and accurate.uk_UA
dc.description.sponsorshipThe work reported in this letter was carried out at Sir Syed University of Engineering & Technology (SSUET), Karachi, Pakistan. The author would like to acknowledge the support and contribution of Prof. Dr. Syed Enamul Haque, Dean Faculty of Engineering at SSUET.uk_UA
dc.identifier.citationA free-space alignment technique for active optical waveguide components / A. Karim // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 3. — С. 319-321. — Бібліогр.: 8 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 42.79.P, 42.82.E
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/121303
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleA free-space alignment technique for active optical waveguide componentsuk_UA
dc.typeArticleuk_UA

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Semicond. Physics Quantum Electronics & Optoelectronics, 2002, № 3