Structure perfection of bulk and near-surface layers in sapphire single crystals

dc.contributor.author	Tkachenko, V.F.
dc.contributor.author	Puzikov, V.M.
dc.contributor.author	Dan`ko, A.Ya.
dc.contributor.author	Budnikov, A.T.
dc.contributor.author	Lukienko, O.A.
dc.date.accessioned	2018-06-16T17:55:02Z
dc.date.available	2018-06-16T17:55:02Z
dc.date.issued	2007
dc.description.abstract	Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing atmosphere by the Czochralski technique and machined and annealed in various manners.	uk_UA
dc.identifier.citation	Structure perfection of bulk and near-surface layers in sapphire single crystals / V.F. Tkachenko, V.M. Puzikov, A.Ya. Dan`ko, A.T. Budnikov, O.A. Lukienko // Functional Materials. — 2007. — Т. 14, № 4. — С. 550-554. — Бібліогр.: 7 назв. — англ.	uk_UA
dc.identifier.issn	1027-5495
dc.identifier.uri	https://nasplib.isofts.kiev.ua/handle/123456789/136939
dc.language.iso	en	uk_UA
dc.publisher	НТК «Інститут монокристалів» НАН України	uk_UA
dc.relation.ispartof	Functional Materials
dc.status	published earlier	uk_UA
dc.subject	Technology	uk_UA
dc.title	Structure perfection of bulk and near-surface layers in sapphire single crystals	uk_UA
dc.title.alternative	Досконалість структури об'єму та приповрхневих шарів монокристалів сапфіру	uk_UA
dc.type	Article	uk_UA

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