High-power low-frequency current oscillations in germanium samples
dc.contributor.author | Pavljuk, S.P. | |
dc.date.accessioned | 2017-05-27T10:00:05Z | |
dc.date.available | 2017-05-27T10:00:05Z | |
dc.date.issued | 2003 | |
dc.description.abstract | Experimental investigation of high-power low-frequency current oscillations in germanium samples with low injecting contacts is discussed in this article. The results obtained were explained by periodic formation, transport along the sample, and collapse of the thermal gradient-drift (TGD) domain. The domain formation mechanism is considered in details in [1]. | uk_UA |
dc.identifier.citation | High-power low-frequency current oscillations in germanium samples / S.P. Pavljuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 1. — С. 19-22. — Бібліогр.: 3 назв. — англ. | uk_UA |
dc.identifier.issn | 1560-8034 | |
dc.identifier.other | PACS: 72.20.-i | |
dc.identifier.other | PACS: 72.80.Cw | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/117868 | |
dc.language.iso | en | uk_UA |
dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
dc.status | published earlier | uk_UA |
dc.title | High-power low-frequency current oscillations in germanium samples | uk_UA |
dc.type | Article | uk_UA |
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