Properties and application of the unequal thickness two-component interference systems

dc.contributor.authorFekeshgazi, I.V.
dc.contributor.authorPervak, V.Yu.
dc.contributor.authorPervak, Yu.A.
dc.date.accessioned2017-06-13T16:17:26Z
dc.date.available2017-06-13T16:17:26Z
dc.date.issued2000
dc.description.abstractThe methods of synthesis and designing of the two-component unequal thickness multilayer interference systems as well as interconnection of their indices of layers are presented. A solution of the problem of suppressing high reflection zones at any harmonic frequency while maintaining high reflection at the operating frequency is proposed. The evolution of refractive zones at the inclined light incidence on the multilayer systems are studied. The results of the synthesis of antireflective coatings for some widely separated wavelengths are discussed. The application of results for the specific spectral characteristics and interference filters are proposed.uk_UA
dc.identifier.citationProperties and application of the unequal thickness two-component interference systems / I.V. Fekeshgazi, V.Yu. Pervak, Yu.A. Pervak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 3. — С. 371-378. — Бібліогр.: 20 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 42.79.Fm,W
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/121169
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleProperties and application of the unequal thickness two-component interference systemsuk_UA
dc.typeArticleuk_UA

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