Investigation of the photoelastic effect in si at high values of the absorptivity

dc.contributor.authorBoiko, I.I.
dc.contributor.authorVenger, Ye.F.
dc.contributor.authorNikitenko, E.V.
dc.contributor.authorSerdega, B.K.
dc.date.accessioned2017-06-10T07:45:35Z
dc.date.available2017-06-10T07:45:35Z
dc.date.issued1999
dc.description.abstractThe birefrigence effect induced by uniaxial elastic deformation has been investigated in monocrystalline Si using theoretical and experimental technigues. To improve a measuring system sensitivity in the range of band absorption, polarization modulation of reffected emission was used. Deformation characteristics of this effect has been measured. The main results obtained for probing light wavelengths from the range of crystal transparency are in a good accordance with conclusions of previons studies. In the range of strong absorption, a considerable change of effect characteristic shapes was found, and their satisfactory accordance with results of theoretical estimations was also ascertained.uk_UA
dc.identifier.citationInvestigation of the photoelastic effect in si at high values of the absorptivity / I.I. Boiko, Ye.F. Venger, E.V. Nikitenko, B.K. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 2. — С. 54-58. — Бібліогр.: 8 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 78.20.C
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/119860
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleInvestigation of the photoelastic effect in si at high values of the absorptivityuk_UA
dc.typeArticleuk_UA

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