Ultrasound influence on exciton emission of GaP light diodes

dc.contributor.authorGontaruk, O.M.
dc.contributor.authorKhivrych, V.I.
dc.contributor.authorPinkovska, M.B.
dc.contributor.authorTartachnyk, V.P.
dc.contributor.authorOlikh, Ya.M.
dc.contributor.authorVernydub, R.M.
dc.contributor.authorOpilat, V.Ya.
dc.date.accessioned2017-05-28T05:44:52Z
dc.date.available2017-05-28T05:44:52Z
dc.date.issued2003
dc.description.abstractElectroluminescence of GaP light diodes, treated by ultrasound at room and low temperatures has been studied. It has been found that short ultrasound caused improvement of red diode emission characteristics while electroluminescence degradation occurred in structures treated by prolong treatment at room temperature. Spectral curves measured under acoustic dynamic mode possess some specific features concerning fine structure. If reverse biased diodes possess microplasma initially, ultrasound action decreases its brightness. Possible mechanisms of the ultrasonic interaction with crystal structure defects have been discussed.uk_UA
dc.identifier.citationUltrasound influence on exciton emission of GaP light diodes / O.M. Gontaruk, V.I. Khivrych, M.B. Pinkovska, V.P. Tartachnyk, Ya.M. Olikh, R.M. Vernydub, V.Ya. Opilat // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 2. — С. 223-226. — Бібліогр.: 11 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 78.55.-m, 78.60.-b, 85.60.Jb
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118000
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleUltrasound influence on exciton emission of GaP light diodesuk_UA
dc.typeArticleuk_UA

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