Thermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions

dc.contributor.authorGavrysh, V.I.
dc.date.accessioned2017-05-29T16:50:26Z
dc.date.available2017-05-29T16:50:26Z
dc.date.issued2012
dc.description.abstractThe nonlinear boundary axially symmetric problem of heat conduction for the thermosensitive piecewise homogeneous layer with reach-through cylindrical inclusion that generates heat has been considered. Using the introduced function, the partial linearization of the original problem has been carried out. With the proposed piecewiselinear approximation of temperature at the boundary surface of the foreign inclusion and on the contact surface of the homogeneous elements of the layer, the problem has been completely linearized. The analytical solution of this problem of finding the introduced function using Hankel integral transform has been formed. The formulae for calculating the desired temperature have been derived.uk_UA
dc.identifier.citationThermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusions / V.I Gavrysh.// Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 3. — С. 247-251. — Бібліогр.: 13 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 74.25.fc
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118314
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleThermal state modeling in thermosensitive elements of microelectronic devices with reach-through foreign inclusionsuk_UA
dc.typeArticleuk_UA

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