Silicon photodiode and preamplifier operation characteristic properties under background radiation conditions

dc.contributor.authorHodovaniouk, V.M.
dc.contributor.authorDoktorovych, I.V.
dc.contributor.authorButenko, V.K.
dc.contributor.authorYuryev, V.H.
dc.contributor.authorDobrovolsky, Yu.G.
dc.date.accessioned2017-06-12T14:43:44Z
dc.date.available2017-06-12T14:43:44Z
dc.date.issued2005
dc.description.abstractThe investigation results of a silicon photodiode (PD) operation with a preamplifier under background radiation conditions are presented. The preamplifier output signal and its frequency characteristic dependence on the input resistance and capacitance are considered, the influence of the PD radiant-flux characteristic under background radiation and the preamplifier output signal dependence on the background current and intrinsic resistance are investigated. It is shown that the change of the PD parameters under background radiation is similar to the influence of the PD equivalents – equivalents of capacitance and resistance.uk_UA
dc.identifier.citationSilicon photodiode and preamplifier operation characteristic properties under background radiation conditions / V.M. Hodovaniouk, I.V. Doktorovych, V.K. Butenko, V.H. Yuryev, Yu.G. Dobrovolsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 1. — С. 83-86. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 85.60 Dw
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/120644
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleSilicon photodiode and preamplifier operation characteristic properties under background radiation conditionsuk_UA
dc.typeArticleuk_UA

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