Some aspects of thermal resistance measurement technique for IMPATT and light-emitting diodes

dc.contributor.authorBelyaev, A.E.
dc.contributor.authorBoltovets, N.S.
dc.contributor.authorKonakova, R.V.
dc.contributor.authorKudryk, Ya.Ya.
dc.contributor.authorSorokin, V.M.
dc.contributor.authorSheremet, V.N.
dc.contributor.authorShynkarenko, V.V.
dc.date.accessioned2017-05-26T17:46:22Z
dc.date.available2017-05-26T17:46:22Z
dc.date.issued2011
dc.description.abstractSome aspects of measuring the thermal resistance to a constant heat flow at a p-n junction–package region in IMPATT and light-emitting diodes are considered. We propose a method of studying the thermal resistance of high-power light-emitting diodes. This method makes it possible to increase accuracy of measuring the thermal resistance by determining the temperature at a linear section of the voltage−temperature curve. A possibility to measure the thermal resistance of IMPATT diodes by using the pulse I-V curves is shown. This enables one to simplify calculations and increase accuracy of measuring the thermal resistance.uk_UA
dc.description.sponsorshipThis work is the part of the project “Development and fabrication of a diagnostic complex for testing of microwave diodes based on wide-gap semiconductors (2008-2012)” and project No 31/4.2.3.1/1833 “Development of methods of investigation of contact systems for high-power light-emitting diodes using III group trinitride heterostructures”.uk_UA
dc.identifier.citationSome aspects of thermal resistance measurement technique for IMPATT and light-emitting diodes / A.E. Belyaev, N.S. Boltovets, R.V. Konakova, Ya.Ya. Kudryk, V.M. Sorokin, V.N. Sheremet, V.V. Shynkarenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 4. — С. 465-469. — Бібліогр.: 17 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 07.20.-n, 85.30.Kk, 85.60.Jb
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/117797
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleSome aspects of thermal resistance measurement technique for IMPATT and light-emitting diodesuk_UA
dc.typeArticleuk_UA

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