Morphologic and optical characterization of ZnO:Co thin films grown by PLD

dc.contributor.authorVuichyk, M.V.
dc.contributor.authorTsybrii, Z.F.
dc.contributor.authorLavoryk, S.R.
dc.contributor.authorSvezhentsova, K.V.
dc.contributor.authorVirt, I.S.
dc.contributor.authorChizhov, A.
dc.date.accessioned2017-05-30T05:44:28Z
dc.date.available2017-05-30T05:44:28Z
dc.date.issued2014
dc.description.abstractThe morphological properties of the surface and optical characteristics of nanocomposite ZnO:Co structures grown on substrates of monocrystalline silicon and sapphire by pulsed laser deposition (PLD) method have been studied. The influence of thermal annealing on formation of characteristically developed surface of films has been analyzed. The experimental transmission and reflectance spectra in the visible region have been measured. In the framework of the dielectric function, the optical constants n and k and dispersion parameters of oscillators that provide the best fit with experimental data have been obtained. From the infrared reflectance spectra of ZnO:Co structures, the frequency positions of Е₁(LO) and Е₁(ТО) optical phonons have been determined. It gives a possibility to suppose that the obtained films possess the wurtzite structure.uk_UA
dc.description.sponsorshipThis work was partially sponsored by Ukrainian-Russian Research Project “Developing of photo- and gas sensitive nanocomposites on the base of semiconductor oxides that are sensibilized by II-VI quantum dots”.uk_UA
dc.identifier.citationMorphologic and optical characterization of ZnO:Co thin films grown by PLD / M.V. Vuichyk, Z.F. Tsybrii, S.R. Lavoryk, K.V. Svezhentsova, I.S. Virt, A. Chizhov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 1. — С. 80-84. — Бібліогр.: 13 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 68.37.Ps, 78.20.Ci, 78.30.-j
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118359
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleMorphologic and optical characterization of ZnO:Co thin films grown by PLDuk_UA
dc.typeArticleuk_UA

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