Diffusion and mobility of native point defects in narrow-gap Hg₁-xCdxTe crystals

dc.contributor.authorElizarov, A.I.
dc.contributor.authorKurbanov, K.R.
dc.contributor.authorBogoboyashchyy, V.V.
dc.date.accessioned2017-05-27T17:04:12Z
dc.date.available2017-05-27T17:04:12Z
dc.date.issued2003
dc.description.abstractResults of investigations of mercury vacancy diffusion in the narrow-gap Hg₁-xCdxTe crystals are presented. A new theory for mercury diffusion in a gradient of native defect concentration is proposed. The theory takes into account the effect of charged defect drift in the internal electric field arising in the crystal at such process. Using this theory, the mercury vacancy diffusion coefficient in the Hg₁-xCdxTe (x ~ 0.2) crystals at 384-690 K has been found: DV = cm²/s. The result is found by fitting the experimental diffusion distribution of the vacancies obtained by a reliable optical method of local free carrier concentration measurements, on the one hand, and data of vacancy coagulation rate measurements, on the other hand. The mercury vacancy diffusion runs rather slowly at T < 690 K.uk_UA
dc.identifier.citationDiffusion and mobility of native point defects in narrow-gap Hg₁-xCdxTe crystals / V.V. Bogoboyashchyy, A.I. Elizarov, K.R. Kurbanov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 1. — С. 47-52. — Бібліогр.: 18 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 73.61.Ga; 61.72.Vv; 61.72.Yx; 61.72.Ss
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/117948
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleDiffusion and mobility of native point defects in narrow-gap Hg₁-xCdxTe crystalsuk_UA
dc.typeArticleuk_UA

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