Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration

Abstract

Optimization of the primary filter in the scheme with fluorescent re-radiator was carried out using the minimum detection limit criterion Cmin. It was established experimentally, that the filtration provides three-fourfold increase for the contrast and 70 % gain for the detection limit. For All trace impurities in ion-exchange resins, the achieved sensitivity about 1 ppm does not yield to values obtained in the complex Barkla scheme using polarized radiation.