Optimization of conditions for treatment of ZnSe crystal surfaces by chemical etching

dc.contributor.authorTomashyk, V.M.
dc.contributor.authorKravtsova, A.S.
dc.contributor.authorTomashyk, Z.F.
dc.contributor.authorStratiychuk, I.B.
dc.contributor.authorGalkin, S.M.
dc.date.accessioned2017-05-26T09:19:12Z
dc.date.available2017-05-26T09:19:12Z
dc.date.issued2013
dc.description.abstractThe process of chemical polishing the undoped and doped ZnSe crystals surface with H₂O₂ – HBr etchants has been studied. The dependence of the samples polishing rate on the concentration of H₂O₂ in HBr solution has been investigated. Surface states after chemical etching have been established using electron and atomic force microscopies, and it was shown that the surface state is improved after chemical etching. Etchant selection to develop slow polishing compositions for chemicalmechanical polishing the investigated materials has been made. Concentration regions of polishing solutions have been found for various types of ZnSe surface treatment: to remove the damaged layer, to control the etching rate, to obtain samples of a given thickness.uk_UA
dc.identifier.citationOptimization of conditions for treatment of ZnSe crystal surfaces by chemical etching / V.М. Tomashyk, А.S. Kravtsova, Z.F. Tomashyk, І.B. Stratiychuk, S.М. Galkin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 2. — С. 140-145. — Бібліогр.: 15 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 81.65.Cf
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/117683
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleOptimization of conditions for treatment of ZnSe crystal surfaces by chemical etchinguk_UA
dc.typeArticleuk_UA

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