Erratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”

dc.contributor.authorMaslov, V.P.
dc.contributor.authorSarsembaeva, A.Z.
dc.contributor.authorSizov, F.F.
dc.date.accessioned2017-05-29T05:41:05Z
dc.date.available2017-05-29T05:41:05Z
dc.date.issued2004
dc.description.abstractThe elastic deformation of thin mirrors is widely used in systems of adaptive optics, however, of influence of elastic deformations on parameters of reflected polarised light in the literature. Using the method of ellipsometry, the influence of elastic deformation on the residual ellipticity of polished samples made of optical materials was studied. The results obtained during the researches have shown that the appli- cation of elastic deformations leads to essential changes of the minimum ellipticity tgρ of polished samples, which testifies to the necessity to take into account this circumstance for devices of adaptive optics, input windows, cryostats and other optical parts working with the changing temperature.uk_UA
dc.identifier.citationErratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials” / V.P. Maslov, A.Z. Sarsembaeva, F.F. Sizov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 2. — С. 224-226. — Бібліогр.: 8 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 81.05.Je
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118181
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleErratum: to the paper “Influence of elastic deformation on the residual ellipticity of polished optical materials”uk_UA
dc.typeArticleuk_UA

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