Transducer based on surface plasmon resonance with thermal modification of metal layer properties

dc.contributor.authorKostiukevych, K.V.
dc.date.accessioned2017-06-14T17:20:31Z
dc.date.available2017-06-14T17:20:31Z
dc.date.issued2016
dc.description.abstractWith the purpose to improve such service characteristics of transducers on the basis of the surface plasmon resonance (SPR) as the sensitivity and stability, we have analyzed the influences of a structure and a relief of the surface of polycrystalline gold films, which are determined by technological conditions of their production and by the low-temperature annealing, on their optical characteristics, namely, the coefficients of refraction, extinction, and light scattering. It is shown that the mechanism of enhancement of the sensitivity of an SPR-based transducer consists in a decrease in the coefficient of extinction of a metal film, as the annealing temperature increases. At the optimum annealing temperature (120°C), we observed the smoothing of a small-scale roughness of the gold film surface, which decreases the scattering of plasmons, favors the defectless formation of protective nano-sized layers, and enhances the sensitivity and stability of the operation of SPR-based transducers.uk_UA
dc.description.sponsorshipThis research was performed in the framework of state project No. 0112U002349 “Physical and technological aspects of development of modern semiconductor materials and functional structures for nano- and optoelectronics”, approved Nov. 28, 2011, supported by National Academy of Sciences of Ukraineuk_UA
dc.identifier.citationTransducer based on surface plasmon resonance with thermal modification of metal layer properties / K.V. Kostiukevych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 255-266. — Бібліогр.: 36 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherDOI: 10.15407/spqeo19.03.255
dc.identifier.otherPACS 73.20.Mf, 78.20.-e
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/121586
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleTransducer based on surface plasmon resonance with thermal modification of metal layer propertiesuk_UA
dc.typeArticleuk_UA

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