Characteristics of confined exciton states in silicon quantum wires

dc.contributor.authorKorbutyak, D.V.
dc.contributor.authorKryuchenko, Yu.V.
dc.contributor.authorKupchak, I.M.
dc.contributor.authorSachenko, A.V.
dc.date.accessioned2017-05-28T06:07:41Z
dc.date.available2017-05-28T06:07:41Z
dc.date.issued2003
dc.description.abstractWe have studied theoretically the combined effect of quantum confinement and "dielectric enhancement" on the characteristics of the exciton ground state in quasi-1D silicon nanowires. Consideration has been made within effective mass and classical image force approximations. As a result, exciton binding energy, total energy of the exciton transition, radiative recombination time, intensity and internal quantum efficiency of the exciton photoluminescence (PL) in quantum wires (QW) have been obtained as functions of wire thickness, dielectric constants of adjacent materials, conduction and valence band-offsets. It was shown that even at room temperatures and moderate intensities of laser excitation the quantum efficiency of the exciton PL can achieve very high values (tens of %) in the case of extremely thin QWs (with thickness 1 - 3 nm). Moreover, according to theory, the exciton recombination time and the quantum efficiency have to be oscillating functions of QW thickness in thickness range 1 - 5 nm due to the indirect band-gap nature of silicon material.uk_UA
dc.description.sponsorshipThis work was supported bу INTAS grant (INTAS Call 2001 NANO-0444), Russian-Ukrainian Program "Nanophуsics and nanoelectronics" and State Fundamental Researches Foundation of Ukraine.uk_UA
dc.identifier.citationCharacteristics of confined exciton states in silicon quantum wires / D.V. Korbutyak, Yu.V. Kryuchenko, I.M. Kupchak, A.V. Sachenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 2. — С. 172-182. — Бібліогр.: 16 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS : 73.20.Dx, 78.66.-w
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118013
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleCharacteristics of confined exciton states in silicon quantum wiresuk_UA
dc.typeArticleuk_UA

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