External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals
dc.contributor.author | Vlaskina, S.I. | |
dc.contributor.author | Mishinova, G.N. | |
dc.contributor.author | Vlaskin, V.I. | |
dc.contributor.author | Rodionov, V.E. | |
dc.contributor.author | Svechnikov, G.S. | |
dc.date.accessioned | 2017-06-13T18:58:56Z | |
dc.date.available | 2017-06-13T18:58:56Z | |
dc.date.issued | 2015 | |
dc.description.abstract | Influence of plastic deformation and high-temperature annealing (T = 2100 °C, t = 1 h) on SiC crystals with grown polytypic junctions demonstrating SF and DL spectra have been presented. SF-i and DL-i type luminescence are inherent to SiC crystals with distortions of the structure related with availability of packing defects that lead to onedimensional disordering (along the c-axis). They are a most expressed in doped crystals with original growth defects. DL luminescence appears in pure crystals at plastic deformation and in doped crystals at a hydrostatic pressure. It enhances at the high temperature annealing, too. | uk_UA |
dc.identifier.citation | External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals / S.I. Vlaskina, G.N. Mishinova, V.I. Vlaskin, V.E. Rodionov, G.S. Svechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 4. — С. 448-451. — Бібліогр.: 28 назв. — англ. | uk_UA |
dc.identifier.issn | 1560-8034 | |
dc.identifier.other | DOI: 10.15407/spqeo18.04.448 | |
dc.identifier.other | PACS 64.70.K-, 77.84.Bw, 81.30.-t | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/121273 | |
dc.language.iso | en | uk_UA |
dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
dc.status | published earlier | uk_UA |
dc.title | External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals | uk_UA |
dc.type | Article | uk_UA |
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