Theoretical consideration of charge transport through the nanoindentor/GaAs junction

dc.contributor.authorKosogor, A.O.
dc.contributor.authorNowak, R.
dc.contributor.authorChrobak, D.
dc.contributor.authorL’vov, V.A.
dc.date.accessioned2017-06-01T04:38:15Z
dc.date.available2017-06-01T04:38:15Z
dc.date.issued2008
dc.description.abstractThe process of indentation of GaAs single crystal by the conductive nanoindentor has been analyzed theoretically. The diode formed by the nanoindentor tip and small area of GaAs platelet has been considered. The evolution of local mechanical stress during the nanoindentation cycle and an appropriate transformation of electric potential difference inherent in tip/GaAs junction are described qualitatively. The nonmonotone variation of the mechanical stress and electric potential difference during the indentation cycle has been disclosed. The current spike experimentally registered in the moment of abrupt penetration of indentor tip into the GaAs platelet has been attributed to the non-monotone variation of potential difference during the indentation cycle.uk_UA
dc.description.sponsorshipThe authors are grateful to Dr. A.G. Shkavro and Dr. V.V. Ilchenko for the helpful discussion.uk_UA
dc.identifier.citationTheoretical consideration of charge transport through the nanoindentor/GaAs junction / A. O. Kosogor, R. Nowak, D. Chrobak, V. A. L'vov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 217-220. — Бібліогр.: 6 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 07.10.Pz, 72.80.Ey, 73.40.-c, 62.40.+i
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118903
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleTheoretical consideration of charge transport through the nanoindentor/GaAs junctionuk_UA
dc.typeArticleuk_UA

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