Use of radiation from PC screen for non-destructive controlling the internal strains in transparent parts
dc.contributor.author | Maslov, V.P. | |
dc.contributor.author | Kachur, N.V. | |
dc.date.accessioned | 2017-05-26T14:10:36Z | |
dc.date.available | 2017-05-26T14:10:36Z | |
dc.date.issued | 2013 | |
dc.description.abstract | It is known that the most widely used method to control internal strains is the optical polarization method. However, the sources of polarized radiation are the most problem issue of this method. There are some difficulties in using this method when testing large-scale optical parts, diameters of which exceed 500 mm. To choose an optical source suitable for solving these tasks, we have analyzed the design of liquidcrystal screens and ascertained the possibility to use their polarized radiation in tests of internal strains in optical parts of large dimensions. Adduced below are the results of investigations of internal strains in parts of sapphire and organic glass. | uk_UA |
dc.identifier.citation | Use of radiation from PC screen for non-destructive controlling the internal strains in transparent parts / V.P. Maslov, N.V. Kachur // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 297-299. — Бібліогр.: 9 назв. — англ. | uk_UA |
dc.identifier.issn | 1560-8034 | |
dc.identifier.other | PACS 42.79.Ci | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/117736 | |
dc.language.iso | en | uk_UA |
dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
dc.status | published earlier | uk_UA |
dc.title | Use of radiation from PC screen for non-destructive controlling the internal strains in transparent parts | uk_UA |
dc.type | Article | uk_UA |
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