The theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration

dc.contributor.authorLiu Kejia
dc.contributor.authorXue Yin
dc.contributor.authorChen Kun
dc.date.accessioned2017-06-12T12:22:34Z
dc.date.available2017-06-12T12:22:34Z
dc.date.issued2016
dc.description.abstractWe have studied the theory of the X-ray diffraction (XRD) absorption peak profile (Liu, K. et al., Adv X-ray Anal, 2010, 54, 17-23) in detail by further theoretical derivation and by verification of the experimental line profile of a standard sample. It was obtained that the deviation between theory and experiment is less than 9% for the standard samples, by ignoring the line profiles in the range of diffraction angle less than 60°, for which the instrumental broadening could not be ignored. And the theoretical formula between FWHM and the Bragg angle 2θ was derived which can be called as the ARF. The results show that the Caglioti's relations should be replaced by the formula derived in this work.uk_UA
dc.identifier.citationThe theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration / Liu Kejia, Xue Yin, Chen Kun // Functional Materials. — 2016. — Т. 23, № 2. — С. 212-217. — Бібліогр.: 5 назв. — англ.uk_UA
dc.identifier.issn1027-5495
dc.identifier.otherDOI: dx.doi.org/10.15407/fm23.02.212
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/120613
dc.language.isoenuk_UA
dc.publisherНТК «Інститут монокристалів» НАН Україниuk_UA
dc.relation.ispartofFunctional Materials
dc.statuspublished earlieruk_UA
dc.subjectCharacterization and propertiesuk_UA
dc.titleThe theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstrationuk_UA
dc.typeArticleuk_UA

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