Size-effect of Kondo scattering in point contacts (revisited)
dc.contributor.author | Yanson, I.K. | |
dc.contributor.author | Fisun, V.V. | |
dc.contributor.author | Bobrov, N.L. | |
dc.contributor.author | Mydosh, J.A. | |
dc.contributor.author | van Ruitenbeek, J.M. | |
dc.date.accessioned | 2021-02-01T17:36:11Z | |
dc.date.available | 2021-02-01T17:36:11Z | |
dc.date.issued | 1998 | |
dc.description.abstract | The size-effect of Kondo-scattering in nanometer-sized metallic point contacts is measured with the simplified, mechanically-controlled break-junction technique for CuMn alloy of different Mn concentrations: 0.017; 0.035; and 0.18 (± 0.017) at.%. The results are compared with our previous publication on nominally 0.1 at.% CuMn alloy [1,2]. The increase of width of the Kondo resonance and enhanced ratio of Kondo-peak intensity to electron-phonon scattering intensity is observed for contacts with sizes smaller than 10 nm. From the comparison of electron-phonon scattering intensity for the pressure-type contacts, which correspond to the clean orifice model, we conclude that the size effect is observed in clean contacts with the shape of a channel (nanowire). | uk_UA |
dc.identifier.citation | Size-effect of Kondo scattering in point contacts (revisited) / I.K. Yanson, V.V. Fisun, N.L. Bobrov, J.A. Mydosh, J.M. van Ruitenbeek // Физика низких температур. — 1998. — Т. 24, № 7. — С. 654-660. — Бібліогр.: 27 назв. — англ. | uk_UA |
dc.identifier.issn | 0132-6414 | |
dc.identifier.other | PACS: 72.15.Qm, 72.10.Fk, 73.40.Ty, 75.20.Hr | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/175545 | |
dc.language.iso | en | uk_UA |
dc.publisher | Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України | uk_UA |
dc.relation.ispartof | Физика низких температур | |
dc.status | published earlier | uk_UA |
dc.subject | Электpонные свойства металлов и сплавов | uk_UA |
dc.title | Size-effect of Kondo scattering in point contacts (revisited) | uk_UA |
dc.type | Article | uk_UA |
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