Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions

dc.contributor.authorFodchuk, I.M.
dc.contributor.authorGutsuliak, I.I.
dc.contributor.authorZaplitniy, R.A.
dc.contributor.authorBalovsyak, S.V.
dc.contributor.authorYaremiy, I.P.
dc.contributor.authorBonchyk, O.Yu.
dc.contributor.authorSavitskiy, G.V.
dc.contributor.authorSyvorotka, I.M.
dc.contributor.authorLytvyn, P.M.
dc.date.accessioned2017-05-26T13:55:26Z
dc.date.available2017-05-26T13:55:26Z
dc.date.issued2013
dc.description.abstractThe scattering field gradient maps of surface layer magnetic domains in Y₂.₉₅La₀.₀₅Fe₅O₁₂ iron-yttrium garnet modified by high-dose ion implantation with nitrogen ions N+ were obtained by the method of magnetic force microscopy. It was found that improving the magnetic properties of thin films, which includes reducing the observed magnetic losses after high-dose implantation, is accompanied by essential ordering of magnetic domains on the surface of the implanted films. There is a direct dependence of the magnetic properties on the dose of implanted atoms, accompanied by a significant dispersion and amorphization of surface layer and formation of a clear magnetic structure.uk_UA
dc.identifier.citationMagnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions / І.M. Fodchuk, I.I. Gutsuliak, R.A. Zaplitniy, S.V. Balovsyak, І.P. Yaremiy, О.Yu. Bonchyk, G.V. Savitskiy, І.M. Syvorotka, P.M. Lytvyn // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 246-252. — Бібліогр.: 24 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 75.50.Gg
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/117733
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleMagnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ionsuk_UA
dc.typeArticleuk_UA

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