Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions
dc.contributor.author | Fodchuk, I.M. | |
dc.contributor.author | Gutsuliak, I.I. | |
dc.contributor.author | Zaplitniy, R.A. | |
dc.contributor.author | Balovsyak, S.V. | |
dc.contributor.author | Yaremiy, I.P. | |
dc.contributor.author | Bonchyk, O.Yu. | |
dc.contributor.author | Savitskiy, G.V. | |
dc.contributor.author | Syvorotka, I.M. | |
dc.contributor.author | Lytvyn, P.M. | |
dc.date.accessioned | 2017-05-26T13:55:26Z | |
dc.date.available | 2017-05-26T13:55:26Z | |
dc.date.issued | 2013 | |
dc.description.abstract | The scattering field gradient maps of surface layer magnetic domains in Y₂.₉₅La₀.₀₅Fe₅O₁₂ iron-yttrium garnet modified by high-dose ion implantation with nitrogen ions N+ were obtained by the method of magnetic force microscopy. It was found that improving the magnetic properties of thin films, which includes reducing the observed magnetic losses after high-dose implantation, is accompanied by essential ordering of magnetic domains on the surface of the implanted films. There is a direct dependence of the magnetic properties on the dose of implanted atoms, accompanied by a significant dispersion and amorphization of surface layer and formation of a clear magnetic structure. | uk_UA |
dc.identifier.citation | Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions / І.M. Fodchuk, I.I. Gutsuliak, R.A. Zaplitniy, S.V. Balovsyak, І.P. Yaremiy, О.Yu. Bonchyk, G.V. Savitskiy, І.M. Syvorotka, P.M. Lytvyn // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 246-252. — Бібліогр.: 24 назв. — англ. | uk_UA |
dc.identifier.issn | 1560-8034 | |
dc.identifier.other | PACS 75.50.Gg | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/117733 | |
dc.language.iso | en | uk_UA |
dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
dc.status | published earlier | uk_UA |
dc.title | Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions | uk_UA |
dc.type | Article | uk_UA |
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