Quantum-sized effects in oxidized silicon structures with surface II-VI nanocrystals

dc.contributor.authorKarachevtseva, L.
dc.contributor.authorKuchmii, S.
dc.contributor.authorKolyadina, O.
dc.contributor.authorLytvynenko, O.
dc.contributor.authorMatveeva, L.
dc.contributor.authorSapelnikova, O.
dc.contributor.authorSmirnov, O.
dc.contributor.authorStroyuk, O.
dc.date.accessioned2017-05-30T05:59:59Z
dc.date.available2017-05-30T05:59:59Z
dc.date.issued2014
dc.description.abstractThe Si-SiO₂ interface in oxidized macroporous silicon structures with surface CdS and ZnO nanocrystals was investigated using the methods of electroreflectance and photoconductivity. The Franz-Keldysh effect, built-in electric field and surface quantization of charge carriers in the Si-SiO₂ region were revealed. The splitting of photoconductivity peaks was detected in the area of indirect band-to-band transition due to quantization of charge carriers in the surface silicon region, too. The latter data correlate with the results of the electroreflectance spectra measurements in the area of direct interband transition of oxidized macroporous silicon structures with surface CdS and ZnO nanocrystals.uk_UA
dc.identifier.citationQuantum-sized effects in oxidized silicon structures with surface II-VI nanocrystals / L. Karachevtseva, S. Kuchmii, O. Kolyadina, O. Lytvynenko, L. Matveeva, O. Sapelnikova, O. Smirnov, O. Stroyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 2. — С. 168-173. — Бібліогр.: 11 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 71.70.Ej, 78.20.Jq
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/118367
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleQuantum-sized effects in oxidized silicon structures with surface II-VI nanocrystalsuk_UA
dc.typeArticleuk_UA

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