Optical properties of thin metal films

dc.contributor.authorKovalenko, S.A.
dc.date.accessioned2017-06-10T08:12:12Z
dc.date.available2017-06-10T08:12:12Z
dc.date.issued1999
dc.description.abstractOptical constants of metallic thin films made from: Ag, Au, Hf, Ir, Mo, Nb, Os, Pd, Pt, Re, Rh, Ru, Ta, W, Zr were determined on the basis of measured index of refraction in region of wavelength λ = 241216 Å. Two types of relations were used for the calculation. Some of them were obtained, with taking into account that refractive index of absorbing medium can be presented in the form ñ = n ± iæ. Other were obtained from Maxwell boundary condition. Both approaches give rise to very close results for æ, however the dependences n = f(λ) for λ > 200 Å are essentially different. The reasons of such differences are discussed.uk_UA
dc.description.sponsorshipThe author would like to emphasize his gratitude to Academician M.P. Lisitsa who is the supervisor and the author of the main idea of this work.uk_UA
dc.identifier.citationOptical properties of thin metal films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 13-20. — Бібліогр.: 25 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS: 78.66; 78.20.C
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/119882
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleOptical properties of thin metal filmsuk_UA
dc.typeArticleuk_UA

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