Micropatterning in bistable cholesteric device with Bragg's reflection

dc.contributor.authorGritsenko, M.I.
dc.contributor.authorKucheev, S.I.
dc.contributor.authorLytvyn, P.M.
dc.contributor.authorTishenko, V.G.
dc.contributor.authorTkach, V.M.
dc.contributor.authorYelshansky, V.B.
dc.date.accessioned2017-06-14T10:54:40Z
dc.date.available2017-06-14T10:54:40Z
dc.date.issued2006
dc.description.abstractIn this work, the method to form bistable patterning in a cholesteric cell with Bragg’s reflection in the visible spectral range is demonstrated. In order to reach this, we used a Si/SiO₂ structure in which a potential relief on SiO₂ surface is induced due to enrichment and depletion of required form areas of the silicon near-surface layer during external electric field action. The patterning of enrichment is determined by the positive charge embedded into SiO₂ film, which is formed by thermodiffusion of aluminum atoms.uk_UA
dc.identifier.citationMicropatterning in bistable cholesteric device with Bragg's reflection / M.I. Gritsenko, S.I. Kucheev, P.M. Lytvyn, V.G. Tishenko, V.M. Tkach, V.B. Yelshansky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 61-64. — Бібліогр.: 14 назв. — англ.uk_UA
dc.identifier.issn1560-8034
dc.identifier.otherPACS 42.79.Kr, 89.75 Kd
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/121435
dc.language.isoenuk_UA
dc.publisherІнститут фізики напівпровідників імені В.Є. Лашкарьова НАН Україниuk_UA
dc.relation.ispartofSemiconductor Physics Quantum Electronics & Optoelectronics
dc.statuspublished earlieruk_UA
dc.titleMicropatterning in bistable cholesteric device with Bragg's reflectionuk_UA
dc.typeArticleuk_UA

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