Laser scanning microscopy of HTS films and devices (Review Article)

Скорочена інформація про документ
dc.contributor.authorZhuravel, A.P.
dc.contributor.authorSivakov, A.G.
dc.contributor.authorTurutanov, O.G.
dc.contributor.authorOmelyanchouk, A.N.
dc.contributor.authorAnlage, S.M.
dc.contributor.authorLukashenko, A.
dc.contributor.authorUstinov, A.V.
dc.contributor.authorAbraimov, D.
dc.date.accessioned2017-06-11T12:44:24Z
dc.date.available2017-06-11T12:44:24Z
dc.date.issued2006
dc.description.abstractThe work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging.uk_UA
dc.description.sponsorshipWe acknowledge valuable contribution from Stephen Remillard (Agile Devices, USA). Yu. Koval (Erlangen University, Germany) is acknowledged for making high-quality samples by electron lithography. This work has been supported in part by the NSF/GOALI DMR-0201261, the program «Nanosystems, nanomaterials, and nanotechnology» of the National Academy of Sciences of Ukraine, and a DFG Grant «Vortex matter in mesoscopic superconductors».uk_UA
dc.identifier.citationLaser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ.uk_UA
dc.identifier.issn0132-6414
dc.identifier.otherPACS: 68.37.–d, 74.25.Nf, 74.78.Bz, 85.25.–j
dc.identifier.urihttps://nasplib.isofts.kiev.ua/handle/123456789/120206
dc.language.isoenuk_UA
dc.publisherФізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН Україниuk_UA
dc.relation.ispartofФизика низких температур
dc.statuspublished earlieruk_UA
dc.subjectExperimental Methods and Applicationsuk_UA
dc.titleLaser scanning microscopy of HTS films and devices (Review Article)uk_UA
dc.typeArticleuk_UA

Файли

Оригінальний контейнер

Зараз показуємо 1 - 1 з 1
Ескіз
Назва:
09-Zhuravel.pdf
Розмір:
927.39 KB
Формат:
Adobe Portable Document Format
Завантажити

Контейнер ліцензії

Зараз показуємо 1 - 1 з 1
Ескіз
Назва:
license.txt
Розмір:
817 B
Формат:
Item-specific license agreed upon to submission
Опис:
Завантажити

Колекція

Физика низких температур, 2006, № 06