The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure
dc.contributor.author | Bazdyreva, S.V. | |
dc.contributor.author | Fedchuk, N.V. | |
dc.contributor.author | Malykhin, S.V. | |
dc.contributor.author | Pugachov, A.T. | |
dc.contributor.author | Reshetnyak, M.V. | |
dc.contributor.author | Zubarev, E.N. | |
dc.date.accessioned | 2017-06-10T10:51:31Z | |
dc.date.available | 2017-06-10T10:51:31Z | |
dc.date.issued | 2013 | |
dc.description.abstract | Method of quantitative estimates of the parameters of the icosahedral quasicrystals substructure, including specific phason defects, developed and successfully worked out using the experimental models of quasicrystalline Al₇₀Pd₂₁Re₉, Ti₄₁.₅Zr₄₁.₅Ni₁₇ and Al₆₄.₅Pd₂₁Mn₁₄.₅ with different preparation technology. The method is based on the analysis of the diffraction lines' width of complete X-ray diffraction pattern. The results are in a good agreement with the prehistory of the samples. | uk_UA |
dc.identifier.citation | The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure / S.V. Bazdyreva, N.V. Fedchuk, S.V. Malykhin, A.T. Pugachov, M.V. Reshetnyak, E.N. Zubarev // Functional Materials. — 2013. — Т. 20, № 1. — С. 81-86. — Бібліогр.: 27 назв. — англ. | uk_UA |
dc.identifier.issn | 1027-5495 | |
dc.identifier.other | DOI: dx.doi.org/10.15407/fm20.01.081 | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/119902 | |
dc.language.iso | en | uk_UA |
dc.publisher | НТК «Інститут монокристалів» НАН України | uk_UA |
dc.relation.ispartof | Functional Materials | |
dc.status | published earlier | uk_UA |
dc.subject | Characterization and properties | uk_UA |
dc.title | The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure | uk_UA |
dc.type | Article | uk_UA |
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