Selective unequal-thickness thin-film filters for IR spectral region
dc.contributor.author | Yaremchuk, I.Ya. | |
dc.contributor.author | Fitio, V.M. | |
dc.contributor.author | Bobitski, Ya.V. | |
dc.date.accessioned | 2017-05-30T16:55:19Z | |
dc.date.available | 2017-05-30T16:55:19Z | |
dc.date.issued | 2008 | |
dc.description.abstract | A new five-layer structure of the dielectric interference filter for the infra-red region of spectrum is investigated. The main spectral parameters of such a narrow-band filter are determined. The dependence of the transmission band half-width on the thickness of a dividing layer in this system is investigated. It is shown that, in the case of the application of PbTe, GeTe, and SnTe layers with a given thickness; their number can be limited to five at providing the necessary selectivity of the filter: practically the 100-% transmission at the resonance frequency and 0.005 % outside the transmission band. | uk_UA |
dc.identifier.citation | Selective unequal-thickness thin-film filters for IR spectral region / I.Ya. Yaremchuk, V.M. Fitio, Ya.V. Bobitski // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 1. — С. 23-25. — Бібліогр.: 11 назв. — англ. | uk_UA |
dc.identifier.issn | 1560-8034 | |
dc.identifier.other | PACS 42.25.Bs, 42.25.Hz, 42.79.Ci | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/118585 | |
dc.language.iso | en | uk_UA |
dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
dc.status | published earlier | uk_UA |
dc.title | Selective unequal-thickness thin-film filters for IR spectral region | uk_UA |
dc.type | Article | uk_UA |
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