Thickness dependences of optical constants for thin layers of some metals and semiconductors

dc.contributor.author	Kovalenko, S.A.
dc.contributor.author	Lisitsa, M.P.
dc.date.accessioned	2017-06-06T12:58:28Z
dc.date.available	2017-06-06T12:58:28Z
dc.date.issued	2001
dc.description.abstract	The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors. It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is absent. The reason that braked the solution of the problem of dimensional optical phenomena in thin layer physics was ascertained.	uk_UA
dc.identifier.citation	Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ.	uk_UA
dc.identifier.issn	1560-8034
dc.identifier.other	PACS: 78.66
dc.identifier.uri	https://nasplib.isofts.kiev.ua/handle/123456789/119328
dc.language.iso	en	uk_UA
dc.publisher	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України	uk_UA
dc.relation.ispartof	Semiconductor Physics Quantum Electronics & Optoelectronics
dc.status	published earlier	uk_UA
dc.title	Thickness dependences of optical constants for thin layers of some metals and semiconductors	uk_UA
dc.type	Article	uk_UA

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