Magnetic force microscopy of YLaFeO films implanted by high dose of nitrogen ions
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Анотація
The scattering field gradient maps of surface layer magnetic domains in
Y₂.₉₅La₀.₀₅Fe₅O₁₂ iron-yttrium garnet modified by high-dose ion implantation with
nitrogen ions N+
were obtained by the method of magnetic force microscopy. It was
found that improving the magnetic properties of thin films, which includes reducing the
observed magnetic losses after high-dose implantation, is accompanied by essential
ordering of magnetic domains on the surface of the implanted films. There is a direct
dependence of the magnetic properties on the dose of implanted atoms, accompanied by
a significant dispersion and amorphization of surface layer and formation of a clear
magnetic structure.
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Magnetic force microscopy of YLaFeO films implanted
by high dose of nitrogen ions / І.M. Fodchuk, I.I. Gutsuliak, R.A. Zaplitniy, S.V. Balovsyak, І.P. Yaremiy, О.Yu. Bonchyk, G.V. Savitskiy, І.M. Syvorotka, P.M. Lytvyn // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2013. — Т. 16, № 3. — С. 246-252. — Бібліогр.: 24 назв. — англ.