Ellipsometric studies of (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ and (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ mixed crystals

Завантаження...
Ескіз

Дата

Назва журналу

Номер ISSN

Назва тому

Видавець

Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України

Анотація

(Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ and (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ mixed crystals were grown using a direct crystallization technique from the melt. Refractive indices and extinction coefficients for mixed crystals were obtained from the spectral ellipsometry measurements. A nonlinear increase in the refractive indices is revealed with the increase of Cu₇PS₆ content. The dispersion of refractive indices is described in the framework of the Wemple–DiDomenico model. The compositional dependences of optical parameters for (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ and (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ mixed crystals are analyzed.

Опис

Теми

Optics

Цитування

Ellipsometric studies of (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ and (Cu₆PS₅Br)₁₋ₓ(Cu₇PS₆)ₓ mixed crystals / I.P. Studenyak, M.M. Luchynets, M.M. Pop, V.I. Studenyak, A.I. Pogodin, O.P. Kokhan, B. Grančič, P. Kus // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2019. — Т. 22, № 3. — С. 347-352. — Бібліогр.: 17 назв. — англ.

item.page.endorsement

item.page.review

item.page.supplemented

item.page.referenced