Characteristics of diode temperature sensors which exhibit Mott conduction in low temperature region
dc.contributor.author | Borblik, V.L. | |
dc.contributor.author | Shwarts, Yu.M. | |
dc.contributor.author | Shwarts, M.M. | |
dc.date.accessioned | 2017-05-28T17:55:15Z | |
dc.date.available | 2017-05-28T17:55:15Z | |
dc.date.issued | 2007 | |
dc.description.abstract | Heavily doped silicon diodes of n⁺⁺-p⁺ type which exhibit the Mott temperature dependence of the forward current in a certain range of bias voltages and low temperatures have studied from the point of their use as temperature sensors. In the region of hopping conduction, the operating signal of diodes U (T) (U is a voltage drop across the diode during the passage of a constant current, T is the temperature) reproduces the Mott law (with opposite sign in the exponent), and the temperature sensitivity of such sensors after passing through a minimum (as the temperature is lowered) increases again up to the values typical of room temperature | uk_UA |
dc.identifier.citation | Characteristics of diode temperature sensors which exhibit Mott conduction in low temperature region / V.L. Borblik, Yu.M. Shwarts, M.M. Shwarts // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2007. — Т. 10, № 3. — С. 44-47. — Бібліогр.: 11 назв. — англ. | uk_UA |
dc.identifier.issn | 1560-8034 | |
dc.identifier.other | PACS 07.07.Df, 61.72.Tt, 72.20.-I, 85.30.Kk | |
dc.identifier.uri | https://nasplib.isofts.kiev.ua/handle/123456789/118120 | |
dc.language.iso | en | uk_UA |
dc.publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України | uk_UA |
dc.relation.ispartof | Semiconductor Physics Quantum Electronics & Optoelectronics | |
dc.status | published earlier | uk_UA |
dc.title | Characteristics of diode temperature sensors which exhibit Mott conduction in low temperature region | uk_UA |
dc.type | Article | uk_UA |
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