Silicon carbide defects and luminescence centers in current heated 6H-SiC
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Анотація
At room temperature yellow photoluminescence with a broad peak of 2.13 eV
is a well-known feature of boron-doped 6H-SiC. Usually yellow luminescence is
regarded as recombination involving both the boron-related deep acceptor and donor
level. But the nature of the deep level has not been clearly understood yet. We annealed
6H-SiC substrates by current in vacuum without boron injection at the temperature of
1350 and 1500 ºC. We received red and yellow luminescence in PL spectrum for the
heated 6H-SiC. The luminescence was regarded as donor-acceptor pair recombination
involving the deep aluminum acceptor related to the adjacent carbon vacancies and
nitrogen donor or the formation of quantum well like regions of 3C-SiC in 6H-SiC
matrix.
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Silicon carbide defects and luminescence centers
in current heated 6H-SiC / S.W. Lee, S.I. Vlaskina, V.I. Vlaskin, I.V. Zaharchenko, V.A. Gubanov, G.N. Mishinova, G.S. Svechnikov, V.E. Rodionov, and S.A. Podlasov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 24-29. — Бібліогр.: 23 назв. — англ.